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Technical Sessions

US‐Only Restricted Session

Thursday, August 27, 2009

Analysis of Energy‐on‐Detector and Other Point‐Response Parameters for Imaging Sensors Using the ASTIF
Glenn Soberman – Northrop Grumman Electronic Systems
Methodologies for Goniometrics, Optics, and Radiometrics for Characterization of AEDC Test Facilities and Sensor Testing
S. L. Steely, H. S. Lowry, R. A. Nicholson, K. D. Mead – AEDC Aerospace Testing Alliance (ATA)
The Applicability of NIST and NASA Calibration Capabilities to GOES Solar Imagers
Michael McGuirk – MIT Lincoln Laboratory; Charles Tarrio and Steven Grantham – NIST; Jonathan Cirtain – NASA Marshall Space Flight Center; Gustave Comeyne III – NOAA
Radiometric Calibration and Complex Scene Projection in the AEDC 7V Chamber Sensor Test Facility
Randy Nicholson, Kimberly Mead, Heard Lowry, Sidney Steely, Henry Horne – AEDC Aerospace Testing Alliance (ATA)
Calibration and Characterization of the 10V Chamber Facility IR Sources Using the NIST BXR and the 10V Internal Radiometer (RCMS)
Henry Horne, Randy Nicholson, Kimberly Mead, William Scott, Earl Kiech – AEDC Aerospace Testing Alliance (ATA)
3-Bounce Trap Internal Calibration Target for CrIS Flight Model 2
Philip Blais, Frederick Williams, Ronald Glumb, Merritt Webb, Sheldon Stokes, David Smith – ITT Corporation
Neon Bulb Used as On‐orbit Spectral Calibrator for CrIS FTS Sensor
Joseph Predina, Tom Pappas, Ronald Glumb – ITT Corporation

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